Reviews

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Nicholas Cunha
"Microtome Precision really knows what they’re doing when it comes to reticle protection. You can tell their work is based on real experience in semiconductor manufacturing, not just theory. They’re thoughtful, responsive, and take the time to answer detailed questions. The products do exactly what they’re supposed to, and the attention to ESD and contamination control is obvious. It’s refreshing to work with a team that understands the practical realities of handling reticles and actually designs around them. Highly recommend Microtome Precision to anyone working in advanced semiconductor environments."
Wooshik Jung, Co-founder and VP, Semiconductor Eng. & Product Dev., Stratio Inc.
""We've received the SMIF pod and the reticle cassette and have integrated them last week. As you have assured, the product works flawlessly and we are very satisfied with your product. Thank you for answering my long questions.""
Patrick Gagnon, Metrology Equipment Engineer, Texas Instruments KFAB
"I have known Gavin since I began to investigate ESD damaged reticles at Texas Instruments. His ground breaking work in this field is visionary and will yield some interesting discoveries once the rest of the world catches up with him."
Mark E. Hogsett Application Engineering Manager Simco-Ion Technology Group
"I have known Gavin since he introduced advanced reticle damage models and analysis to the SEMI Task Force Electrostatics group. He brings an uncommon skill in analysis to this problem, as well as the ability to translate the more technical aspects for the general semiconductor community. As with anything that involves change, there seems to be slow adoption of the guidance in SEMI Standard E163 that evolved through Gavin’s work. This is to the detriment of semiconductor operations world-wide and I hope to see that change."
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